Surface Profilometer for Precise Surface Analysis Tool

Introduction

The surface profilometer plays a critical role in modern industrial quality assurance by delivering fast, repeatable, and highly accurate surface measurements. Compared with traditional manual inspection methods, it significantly improves measurement efficiency, reduces operator error, and ensures consistent data output for production evaluation. This system is commonly applied in semiconductor manufacturing, automotive engineering, aerospace components, and precision machining industries where strict surface quality standards are required.

Key Features

Stable Performance: Consistent and reliable operation.
Fast Transmission: Quick data transmission for efficiency.
Automatic Calibration: Ensures precise measurements with minimal effort.
Accurate Measurement: Provides high-accuracy results for critical measurements.
Rapid Response: Fast response time for efficient analysis.
Real-Time Monitoring: Monitors measurements and displays results in real time.

Roughness Profilometer - Technical Specifications

Contour Measurement Functions:

Dimensions: Horizontal distance, vertical distance, linear distance, radius, and diameter.
Angles: Horizontal angle, vertical angle, and included angle.
Positional Tolerances: Parallelism and perpendicularity.
Form Tolerances: Straightness, convexity, and arc profile tolerances.
Auxiliary Generation: Auxiliary points, auxiliary lines, and auxiliary circles.

Cryptogram Analysis:

Ra, Rammax, Ramin, Rasd, Rp, Rpmax, Rpmin, Rpsd, Rv, Rvmax, Rvmin, Rvsd, Rz, Rzmax, Rzmin, Rzsd, R3z, Rc, Rcmax, Rcmin, Rcsd, Rt, Rq, Rqmax, Rqmin, Rdsd, Rsk, Rskmax, Rsmin, Rsksd, Rku, Rkumax, Rkumin, Rkusd, Rsm, Rsmmax, Rsmmin, Rsmsd, Rs, R△a, R△amax, R△amin, R△asd, R△q, R△qmax, R△qmin, R△qsd, Rk, Rpk, Rvk, Mr1, Mr2, Rλa, Rλamax, Rλamin, Rλasd, Rλq, Rλqmax, Rλqmin, Rλqsd, Rδc, Rpc, Rmr

Waviness Analysis:

Wa, Wamax, Wamin, Wasd, Wsa, Wca, Wa08, Wc, Wcmax, Wcmin, Wcsd, Wt, Wz, Wzmax, Wzmin, Wzsd, Wp, Wpmax, Wpmin, Wpsd, Wv, Wvmax, Wvmin, Wcsd, Wq, Wqmax, Wqmin, Wqsd, Wsm, Wsmmax, Wsmmin, Wsmsd, Wsk, Wskmax, Wskmin, Wsksd, Wku, Wkumax, Wkumin, Wkusd, W△q, W△qmax, W△qmin, W△qsd, Wδc, Wmr

Original Contour Analysis:

Pa, Pt, Pp, Pc, Pv, Pz, Pq, Psm, Psk, Pku, RzJ, Rpq, Rvq, Rmq, Pmr, P△q, Avh, Hmax, Hmin, Area, Pδc, Tilta

Equipment Parameters

Measurement range	X-direction driver		130mm
	Z1	Profile measurement range	40mm
	Z1	Roughness measurement range	±1500μm
	Z1	Resolution 0.02 micrometers
	Z-axis height (column)		550mm
	Minimum detectable inner hole		10mm
Contour technical parameters	Linearity		±（0.7+\|0.12H\|）μm
	Circularity		±（1.2+R/12）μm
	Angle		±1′
	Straightness		0.5μm/100mm
Roughness technical parameters	Linearity accuracy		≤±5%
	Residual noise		≤0.005μm
	Repeatability stability		Trial value 3%
	Cutoff wavelength		0.025, 0.08, 0.25, 0.8, 2.5, 8mm
	Evaluation length		λcX1, 2, 3, 4, 5
Sensor	Type		USA
	Resolution		0.02μm
	Origin		USA
Angle of ascent			77 degrees ascent, 88 degrees descent

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Backed by over 25 years of engineering experience, our team offers comprehensive services—from customized mold design and precision machining to full-scale production—supported by a robust quality assurance system and proactive customer service. Certified under ISO9001, ISO14001, and IATF 16949, we continually strive for excellence in quality, innovation, and customer satisfaction.